1. Vacatures
  2. Universiteit Twente (UT)
  3. NEXT 3D ( Near-field Enhanced X-ray fluorescence metrology for the characterization of nanometer-Thin films and 3D structures)

NEXT 3D ( Near-field Enhanced X-ray fluorescence metrology for the characterization of nanometer-Thin films and 3D structures)

Are you interested in exploring the exiting field of 3D X-ray metrology for high-tech applications? We are looking for a motivated and skilled PhD researcher …

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Arbeidsvoorwaarden

Standplaats:
Drienerlolaan, Enschede, Overijssel
Dienstverband:
Tijdelijk contract / Tijdelijke opdracht
Uren per week:
38 - 38 uur
Salarisindicatie:
€ 2325 - € 2972 per maand
Opleidingsniveau:
WO

Functieomschrijving

Are you interested in exploring the exiting field of 3D X-ray metrology for high-tech applications?

We are looking for a motivated and skilled PhD researcher to work on exploring the experimental and theoretical aspects of a recently discovered 3D fluorescent X-ray standing wave technique (XSW).

Recent developments in nano-fabrication and the continuous down scaling of the characteristic features in nano-devices are calling for the development of new, non-destructive, 3D structural characterization methods. Currently, the widely used scanning electron microscopy is approaching the limits of its applicability because of the difficulty to characterize buried patterns. On the other hand, X-ray scattering based techniques receive more and more attention as they can have ultra-high resolution and the ability to characterize buried structures due to a large X-ray penetration depth. The aim of our research group is to develop the physics solutions for these tasks, such that new characterization approaches can be realized not only in the laboratory, but also in the industrial environment.

We have recently demonstrated the theoretical possibility of the 3D X-ray standing wave (see image) formed in structured 3D films to be used for angular mapping of the excited X-ray fluorescence, that holds the information about the internal 3D structure of buried nano-objects.

Your task will be to experimentally and numerically investigate the potentials of this 3D X-ray standing wave technique and explore algorithms of experimental data analysis obtained from the-state-of-the-art structures provided by our industrial partners.

The project will be carried under the umbrella of the Industrial Focus Group XUV Optics where a new multidisciplinary research program on growth, characterization and application of thin film devices, primarily for optical application, has started. We develop forefront fundamental research, relevant to high tech applications (www.utwente.nl/xuv/). The research will take place in a state-of-the-art thin film laboratory within the MESA+ Institute for Nanotechnology at the University of Twente, in collaboration with various industrial partners.

Functie-eisen

  • You have a Master’s degree in solid state or surface physics, optics, materials science or a related field.
  • You have a solid background in physics simulations using, at list, high-level languages like Python or Matlab.
  • You are familiar with numerical methods in mathematics, physics and specifically in linear algebra.
  • You are an excellent team player that likes to work in an enthusiastic group of scientists and engineers working on a common theme.
  • You are creative, like to push boundaries, and are highly motivated to address a major science challenge in thin film physics.
  • You are fluent in English and able to collaborate intensively with industrial and academic parties in regular meetings and work visits.
  • You are able to join our team before the 1st of December 2019

Conditions

You will be appointed on a fulltime position for four years. The university offers a dynamic ecosystem with enthusiastic colleagues in a stimulating scientific environment. The PhD salary is € 2.325,- euro in the first year and increases to € 2.972,- euro in the fourth year. The offer further involves: a holiday allowance of 8% of the gross annual salary and a year-end bonus of 8.3%.

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